Extended signature testing algorithms for VLSI

Extended signature testing algorithms for VLSI

碩士 === 大同工學院 === 電機工程研究所 === 75 ===

Bibliographic Details
Main Authors:	WANG, WEI-LUN, 王維倫
Other Authors:	GUO, MING-YAN
Format:	Others
Language:	zh-TW
Published:	1987
Online Access:	http://ndltd.ncl.edu.tw/handle/38569996012278427202

Description
Summary:	碩士 === 大同工學院 === 電機工程研究所 === 75 ===