Extended signature testing algorithms for VLSI

Extended signature testing algorithms for VLSI

碩士 === 大同工學院 === 電機工程研究所 === 75 ===

Bibliographic Details
Main Authors: WANG, WEI-LUN, 王維倫
Other Authors: GUO, MING-YAN
Format: Others
Language:zh-TW
Published: 1987
Online Access:http://ndltd.ncl.edu.tw/handle/38569996012278427202
id ndltd-TW-075TTIT2442013
record_format oai_dc
spelling ndltd-TW-075TTIT24420132015-10-13T17:44:40Z http://ndltd.ncl.edu.tw/handle/38569996012278427202 Extended signature testing algorithms for VLSI 超大型積體電路之新型簽字測試演算法 WANG, WEI-LUN 王維倫 碩士 大同工學院 電機工程研究所 75 GUO, MING-YAN ZHANG, SAN-ZHU 郭明彥 張三祝 1987 學位論文 ; thesis 0 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 大同工學院 === 電機工程研究所 === 75 ===
author2 GUO, MING-YAN
author_facet GUO, MING-YAN
WANG, WEI-LUN
王維倫
author WANG, WEI-LUN
王維倫
spellingShingle WANG, WEI-LUN
王維倫
Extended signature testing algorithms for VLSI
author_sort WANG, WEI-LUN
title Extended signature testing algorithms for VLSI
title_short Extended signature testing algorithms for VLSI
title_full Extended signature testing algorithms for VLSI
title_fullStr Extended signature testing algorithms for VLSI
title_full_unstemmed Extended signature testing algorithms for VLSI
title_sort extended signature testing algorithms for vlsi
publishDate 1987
url http://ndltd.ncl.edu.tw/handle/38569996012278427202
work_keys_str_mv AT wangweilun extendedsignaturetestingalgorithmsforvlsi
AT wángwéilún extendedsignaturetestingalgorithmsforvlsi
AT wangweilun chāodàxíngjītǐdiànlùzhīxīnxíngqiānzìcèshìyǎnsuànfǎ
AT wángwéilún chāodàxíngjītǐdiànlùzhīxīnxíngqiānzìcèshìyǎnsuànfǎ
_version_ 1717783883067424768

Similar Items