Characterization of Si and Sil-xGex epilayers grown by RTCBE

碩士 === 國立交通大學 === 材料科學工程研究所 === 78 ===

Bibliographic Details
Main Authors:	WANG,ZHENG-TANG, 王政堂
Other Authors:	ZHANG,JUN-YAN
Format:	Others
Language:	zh-TW
Published:	1991
Online Access:	http://ndltd.ncl.edu.tw/handle/45243747351920613878

id	ndltd-TW-078NCTU2159002
record_format	oai_dc
spelling	ndltd-TW-078NCTU21590022015-10-13T15:21:04Z http://ndltd.ncl.edu.tw/handle/45243747351920613878 Characterization of Si and Sil-xGex epilayers grown by RTCBE 以快速升溫化學束磊晶法成長矽鍺磊晶及其特性分析 WANG,ZHENG-TANG 王政堂碩士國立交通大學材料科學工程研究所 78 ZHANG,JUN-YAN LIU,ZENG-FENG 張俊彥劉增豐 1991 學位論文 ; thesis 67 zh-TW
collection	NDLTD
language	zh-TW
format	Others
sources	NDLTD
description	碩士 === 國立交通大學 === 材料科學工程研究所 === 78 ===
author2	ZHANG,JUN-YAN
author_facet	ZHANG,JUN-YAN WANG,ZHENG-TANG 王政堂
author	WANG,ZHENG-TANG 王政堂
spellingShingle	WANG,ZHENG-TANG 王政堂 Characterization of Si and Sil-xGex epilayers grown by RTCBE
author_sort	WANG,ZHENG-TANG
title	Characterization of Si and Sil-xGex epilayers grown by RTCBE
title_short	Characterization of Si and Sil-xGex epilayers grown by RTCBE
title_full	Characterization of Si and Sil-xGex epilayers grown by RTCBE
title_fullStr	Characterization of Si and Sil-xGex epilayers grown by RTCBE
title_full_unstemmed	Characterization of Si and Sil-xGex epilayers grown by RTCBE
title_sort	characterization of si and sil-xgex epilayers grown by rtcbe
publishDate	1991
url	http://ndltd.ncl.edu.tw/handle/45243747351920613878
work_keys_str_mv	AT wangzhengtang characterizationofsiandsilxgexepilayersgrownbyrtcbe AT wángzhèngtáng characterizationofsiandsilxgexepilayersgrownbyrtcbe AT wangzhengtang yǐkuàisùshēngwēnhuàxuéshùlěijīngfǎchéngzhǎngxìduǒlěijīngjíqítèxìngfēnxī AT wángzhèngtáng yǐkuàisùshēngwēnhuàxuéshùlěijīngfǎchéngzhǎngxìduǒlěijīngjíqítèxìngfēnxī
_version_	1717764183161831424

Characterization of Si and Sil-xGex epilayers grown by RTCBE

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