Test generation and partial scan design aided with a probabilistic testability measure for sequential circuits
碩士 === 國立交通大學 === 電子研究所 === 78 ===
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| Format: | Others |
| Language: | zh-TW |
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1990
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| Online Access: | http://ndltd.ncl.edu.tw/handle/30526910504906730506 |
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ndltd-TW-078NCTU2430020 |
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oai_dc |
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ndltd-TW-078NCTU24300202015-10-13T15:21:05Z http://ndltd.ncl.edu.tw/handle/30526910504906730506 Test generation and partial scan design aided with a probabilistic testability measure for sequential circuits 可測性計量輔助之序向電路測試圖樣產生器及部分掃描設計方法 CHEN,WEN-BIN 陳文斌 碩士 國立交通大學 電子研究所 78 LI,CHONG-REN 李崇仁 1990 學位論文 ; thesis 58 zh-TW |
| collection |
NDLTD |
| language |
zh-TW |
| format |
Others
|
| sources |
NDLTD |
| description |
碩士 === 國立交通大學 === 電子研究所 === 78 ===
|
| author2 |
LI,CHONG-REN |
| author_facet |
LI,CHONG-REN CHEN,WEN-BIN 陳文斌 |
| author |
CHEN,WEN-BIN 陳文斌 |
| spellingShingle |
CHEN,WEN-BIN 陳文斌 Test generation and partial scan design aided with a probabilistic testability measure for sequential circuits |
| author_sort |
CHEN,WEN-BIN |
| title |
Test generation and partial scan design aided with a probabilistic testability measure for sequential circuits |
| title_short |
Test generation and partial scan design aided with a probabilistic testability measure for sequential circuits |
| title_full |
Test generation and partial scan design aided with a probabilistic testability measure for sequential circuits |
| title_fullStr |
Test generation and partial scan design aided with a probabilistic testability measure for sequential circuits |
| title_full_unstemmed |
Test generation and partial scan design aided with a probabilistic testability measure for sequential circuits |
| title_sort |
test generation and partial scan design aided with a probabilistic testability measure for sequential circuits |
| publishDate |
1990 |
| url |
http://ndltd.ncl.edu.tw/handle/30526910504906730506 |
| work_keys_str_mv |
AT chenwenbin testgenerationandpartialscandesignaidedwithaprobabilistictestabilitymeasureforsequentialcircuits AT chénwénbīn testgenerationandpartialscandesignaidedwithaprobabilistictestabilitymeasureforsequentialcircuits AT chenwenbin kěcèxìngjìliàngfǔzhùzhīxùxiàngdiànlùcèshìtúyàngchǎnshēngqìjíbùfēnsǎomiáoshèjìfāngfǎ AT chénwénbīn kěcèxìngjìliàngfǔzhùzhīxùxiàngdiànlùcèshìtúyàngchǎnshēngqìjíbùfēnsǎomiáoshèjìfāngfǎ |
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1717764289418231808 |