Test generation and partial scan design aided with a probabilistic testability measure for sequential circuits
碩士 === 國立交通大學 === 電子研究所 === 78 ===
Main Authors: | CHEN,WEN-BIN, 陳文斌 |
---|---|
Other Authors: | LI,CHONG-REN |
Format: | Others |
Language: | zh-TW |
Published: |
1990
|
Online Access: | http://ndltd.ncl.edu.tw/handle/30526910504906730506 |
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