Pseudoexhaustive testable PLA design with low overhead

碩士 === 國立交通大學 === 電子研究所 === 78 ===

Bibliographic Details
Main Authors: ZHENG,YUN-ZHONG, 鄭允仲
Other Authors: SHEN,WEN-REN
Format: Others
Language:zh-TW
Published: 1990
Online Access:http://ndltd.ncl.edu.tw/handle/84930994965024997526
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spelling ndltd-TW-078NCTU24300352015-10-13T15:21:05Z http://ndltd.ncl.edu.tw/handle/84930994965024997526 Pseudoexhaustive testable PLA design with low overhead 低額外的電路虛擬全程可測試可程式邏輯陣列設計 ZHENG,YUN-ZHONG 鄭允仲 碩士 國立交通大學 電子研究所 78 SHEN,WEN-REN 沈文仁 1990 學位論文 ; thesis 64 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立交通大學 === 電子研究所 === 78 ===
author2 SHEN,WEN-REN
author_facet SHEN,WEN-REN
ZHENG,YUN-ZHONG
鄭允仲
author ZHENG,YUN-ZHONG
鄭允仲
spellingShingle ZHENG,YUN-ZHONG
鄭允仲
Pseudoexhaustive testable PLA design with low overhead
author_sort ZHENG,YUN-ZHONG
title Pseudoexhaustive testable PLA design with low overhead
title_short Pseudoexhaustive testable PLA design with low overhead
title_full Pseudoexhaustive testable PLA design with low overhead
title_fullStr Pseudoexhaustive testable PLA design with low overhead
title_full_unstemmed Pseudoexhaustive testable PLA design with low overhead
title_sort pseudoexhaustive testable pla design with low overhead
publishDate 1990
url http://ndltd.ncl.edu.tw/handle/84930994965024997526
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