Esd-induced failure analysis of CMOS integrated circuits

Esd-induced failure analysis of CMOS integrated circuits

碩士 === 國立交通大學 === 電子研究所 === 78 ===

Bibliographic Details
Main Authors: ZHANG,JIA-JIAN, 張嘉艦
Other Authors: CHEN,MING-ZHE
Format: Others
Language:zh-TW
Published: 1991
Online Access:http://ndltd.ncl.edu.tw/handle/68671519279434543802
id ndltd-TW-078NCTU2430107
record_format oai_dc
spelling ndltd-TW-078NCTU24301072015-10-13T15:21:05Z http://ndltd.ncl.edu.tw/handle/68671519279434543802 Esd-induced failure analysis of CMOS integrated circuits 互補式金氧半積體電路中靜電放電引起之故障分析 ZHANG,JIA-JIAN 張嘉艦 碩士 國立交通大學 電子研究所 78 CHEN,MING-ZHE 陳明哲 1991 學位論文 ; thesis 21 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立交通大學 === 電子研究所 === 78 ===
author2 CHEN,MING-ZHE
author_facet CHEN,MING-ZHE
ZHANG,JIA-JIAN
張嘉艦
author ZHANG,JIA-JIAN
張嘉艦
spellingShingle ZHANG,JIA-JIAN
張嘉艦
Esd-induced failure analysis of CMOS integrated circuits
author_sort ZHANG,JIA-JIAN
title Esd-induced failure analysis of CMOS integrated circuits
title_short Esd-induced failure analysis of CMOS integrated circuits
title_full Esd-induced failure analysis of CMOS integrated circuits
title_fullStr Esd-induced failure analysis of CMOS integrated circuits
title_full_unstemmed Esd-induced failure analysis of CMOS integrated circuits
title_sort esd-induced failure analysis of cmos integrated circuits
publishDate 1991
url http://ndltd.ncl.edu.tw/handle/68671519279434543802
work_keys_str_mv AT zhangjiajian esdinducedfailureanalysisofcmosintegratedcircuits
AT zhāngjiājiàn esdinducedfailureanalysisofcmosintegratedcircuits
AT zhangjiajian hùbǔshìjīnyǎngbànjītǐdiànlùzhōngjìngdiànfàngdiànyǐnqǐzhīgùzhàngfēnxī
AT zhāngjiājiàn hùbǔshìjīnyǎngbànjītǐdiànlùzhōngjìngdiànfàngdiànyǐnqǐzhīgùzhàngfēnxī
_version_ 1717764327698595840

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