Characterization of devices fabricated by low temperature UHV/CVD

碩士 === 國立交通大學 === 電子研究所 === 80 ===

Bibliographic Details
Main Authors: HAN, LIANG-KAI, 韓良愷
Other Authors: ZHANG, JUN-YAN
Format: Others
Language:zh-TW
Published: 1992
Online Access:http://ndltd.ncl.edu.tw/handle/44891579800013389989
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spelling ndltd-TW-080NCTU24300652015-10-13T14:16:54Z http://ndltd.ncl.edu.tw/handle/44891579800013389989 Characterization of devices fabricated by low temperature UHV/CVD 以低溫超高真空化學汽相沈積法所製元件特性 HAN, LIANG-KAI 韓良愷 碩士 國立交通大學 電子研究所 80 ZHANG, JUN-YAN 張俊彥 1992 學位論文 ; thesis 76 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立交通大學 === 電子研究所 === 80 ===
author2 ZHANG, JUN-YAN
author_facet ZHANG, JUN-YAN
HAN, LIANG-KAI
韓良愷
author HAN, LIANG-KAI
韓良愷
spellingShingle HAN, LIANG-KAI
韓良愷
Characterization of devices fabricated by low temperature UHV/CVD
author_sort HAN, LIANG-KAI
title Characterization of devices fabricated by low temperature UHV/CVD
title_short Characterization of devices fabricated by low temperature UHV/CVD
title_full Characterization of devices fabricated by low temperature UHV/CVD
title_fullStr Characterization of devices fabricated by low temperature UHV/CVD
title_full_unstemmed Characterization of devices fabricated by low temperature UHV/CVD
title_sort characterization of devices fabricated by low temperature uhv/cvd
publishDate 1992
url http://ndltd.ncl.edu.tw/handle/44891579800013389989
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AT hánliángkǎi yǐdīwēnchāogāozhēnkōnghuàxuéqìxiāngchénjīfǎsuǒzhìyuánjiàntèxìng
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