JIN, H., 金鴻鈞, & ZHOU, C. (1993). 紅外線光學薄膜殘留應力量測暨光學外差偏振干涉儀量測旋光性之研究.
Chicago Style (17th ed.) CitationJIN, HONG-JUN, 金鴻鈞, and CHENG ZHOU. 紅外線光學薄膜殘留應力量測暨光學外差偏振干涉儀量測旋光性之研究. 1993.
MLA (8th ed.) CitationJIN, HONG-JUN, et al. 紅外線光學薄膜殘留應力量測暨光學外差偏振干涉儀量測旋光性之研究. 1993.
Warning: These citations may not always be 100% accurate.