Characterization and Optical Properties of CdS Thin Films by Thermal Evaporation and Gas Evaporation Techniques

碩士 === 國立交通大學 === 電子物理學系 === 82 === Thin films of high orientation cadmium sulfide were fabricated by high vacuum thermal evaporation technique and gas evaporation technique. Two types of substrates, Corning's 7059 glass and(100) p-typ...

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Bibliographic Details
Main Authors: W.Y.Shyu, 徐文義
Other Authors: D.S.Chuu
Format: Others
Language:en_US
Published: 1994
Online Access:http://ndltd.ncl.edu.tw/handle/75911348153701399998
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Summary:碩士 === 國立交通大學 === 電子物理學系 === 82 === Thin films of high orientation cadmium sulfide were fabricated by high vacuum thermal evaporation technique and gas evaporation technique. Two types of substrates, Corning's 7059 glass and(100) p-type silicon,were used to deposit the films at room temperature.The grain sizes of these films were found in a range of 500-1500 A in adiameter.The as-deposited films were characterized by X-ray diffraction(XRD) and scanning electron microscopy (SEM).Raman scattering spectra and photoluminescence( PL) spectra for various temperature were measured. Temperature dependence of the peaks positions of Raman scattering spectra and PL spectra were studied and compared with the available results of previous works.