Characterization and Optical Properties of CdS Thin Films by Thermal Evaporation and Gas Evaporation Techniques

碩士 === 國立交通大學 === 電子物理學系 === 82 === Thin films of high orientation cadmium sulfide were fabricated by high vacuum thermal evaporation technique and gas evaporation technique. Two types of substrates, Corning's 7059 glass and(100) p-typ...

Full description

Bibliographic Details
Main Authors:	W.Y.Shyu, 徐文義
Other Authors:	D.S.Chuu
Format:	Others
Language:	en_US
Published:	1994
Online Access:	http://ndltd.ncl.edu.tw/handle/75911348153701399998

id	ndltd-TW-082NCTU0429005
record_format	oai_dc
spelling	ndltd-TW-082NCTU04290052016-07-18T04:09:35Z http://ndltd.ncl.edu.tw/handle/75911348153701399998 Characterization and Optical Properties of CdS Thin Films by Thermal Evaporation and Gas Evaporation Techniques 利用高真空蒸鍍及氣體蒸鍍法製作硫化鎘薄膜及其光學性質的量測 W.Y.Shyu 徐文義碩士國立交通大學電子物理學系 82 Thin films of high orientation cadmium sulfide were fabricated by high vacuum thermal evaporation technique and gas evaporation technique. Two types of substrates, Corning's 7059 glass and(100) p-type silicon,were used to deposit the films at room temperature.The grain sizes of these films were found in a range of 500-1500 A in adiameter.The as-deposited films were characterized by X-ray diffraction(XRD) and scanning electron microscopy (SEM).Raman scattering spectra and photoluminescence( PL) spectra for various temperature were measured. Temperature dependence of the peaks positions of Raman scattering spectra and PL spectra were studied and compared with the available results of previous works. D.S.Chuu 褚德三 1994 學位論文 ; thesis 53 en_US
collection	NDLTD
language	en_US
format	Others
sources	NDLTD
description	碩士 === 國立交通大學 === 電子物理學系 === 82 === Thin films of high orientation cadmium sulfide were fabricated by high vacuum thermal evaporation technique and gas evaporation technique. Two types of substrates, Corning's 7059 glass and(100) p-type silicon,were used to deposit the films at room temperature.The grain sizes of these films were found in a range of 500-1500 A in adiameter.The as-deposited films were characterized by X-ray diffraction(XRD) and scanning electron microscopy (SEM).Raman scattering spectra and photoluminescence( PL) spectra for various temperature were measured. Temperature dependence of the peaks positions of Raman scattering spectra and PL spectra were studied and compared with the available results of previous works.
author2	D.S.Chuu
author_facet	D.S.Chuu W.Y.Shyu 徐文義
author	W.Y.Shyu 徐文義
spellingShingle	W.Y.Shyu 徐文義 Characterization and Optical Properties of CdS Thin Films by Thermal Evaporation and Gas Evaporation Techniques
author_sort	W.Y.Shyu
title	Characterization and Optical Properties of CdS Thin Films by Thermal Evaporation and Gas Evaporation Techniques
title_short	Characterization and Optical Properties of CdS Thin Films by Thermal Evaporation and Gas Evaporation Techniques
title_full	Characterization and Optical Properties of CdS Thin Films by Thermal Evaporation and Gas Evaporation Techniques
title_fullStr	Characterization and Optical Properties of CdS Thin Films by Thermal Evaporation and Gas Evaporation Techniques
title_full_unstemmed	Characterization and Optical Properties of CdS Thin Films by Thermal Evaporation and Gas Evaporation Techniques
title_sort	characterization and optical properties of cds thin films by thermal evaporation and gas evaporation techniques
publishDate	1994
url	http://ndltd.ncl.edu.tw/handle/75911348153701399998
work_keys_str_mv	AT wyshyu characterizationandopticalpropertiesofcdsthinfilmsbythermalevaporationandgasevaporationtechniques AT xúwényì characterizationandopticalpropertiesofcdsthinfilmsbythermalevaporationandgasevaporationtechniques AT wyshyu lìyònggāozhēnkōngzhēngdùjíqìtǐzhēngdùfǎzhìzuòliúhuàlìbáomójíqíguāngxuéxìngzhìdeliàngcè AT xúwényì lìyònggāozhēnkōngzhēngdùjíqìtǐzhēngdùfǎzhìzuòliúhuàlìbáomójíqíguāngxuéxìngzhìdeliàngcè
_version_	1718351633994219520

Characterization and Optical Properties of CdS Thin Films by Thermal Evaporation and Gas Evaporation Techniques

Similar Items