Theoretical Analysis for Charge Transfer and Fringing Field Effects of Charge-Coupled Devices

碩士 === 國立交通大學 === 電子研究所 === 82 === Presented here is an analysis simulation tool for Charge- coupled devices(CCD), including charge capacity model and charge transfer inefficiency analytical model with and without considering effective fat...

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Bibliographic Details
Main Authors: Bin-Chang Wu, 吳炳昌
Other Authors: Tan-Fu Lei
Format: Others
Language:en_US
Published: 1994
Online Access:http://ndltd.ncl.edu.tw/handle/12704831058245490945
Description
Summary:碩士 === 國立交通大學 === 電子研究所 === 82 === Presented here is an analysis simulation tool for Charge- coupled devices(CCD), including charge capacity model and charge transfer inefficiency analytical model with and without considering effective fat zero (dark current). The surface potential with no minority carrier in our simulation is so easy to get by Fourier series, without using numerical method and the CPU time is very greatly reduced. We firstly propose a simple charge capacity model to simulate signal-charge distribution and verified by numerical results. And we propose a new method to determine the minimum fringing field from the final time constant. By this new method and charge-signal distribution we can explain the controversy of the result of the short gate length. In addition, simulation results shows that a trade-off between the transfer efficiency and the magnitude of signal charge due to the charge screening effect. Finally, a analytical model of wide range temperature is proposed and simulation results matches the experimental data very good. By this model, we can obtain a complete energy- dependent interface state distribution.