Study of Oxide and Interface Traps in Ultra-Thin Nitrided Oxide MOSFET Using Hot-Carrier Injection from a Buried Junction Injector

Study of Oxide and Interface Traps in Ultra-Thin Nitrided Oxide MOSFET Using Hot-Carrier Injection from a Buried Junction Injector

碩士 === 國立清華大學 === 電機工程研究所 === 82 ===

Bibliographic Details
Main Authors: Shih-wei Tsai, 蔡世偉
Other Authors: Charles C.C. Hsu
Format: Others
Language:zh-TW
Published: 1994
Online Access:http://ndltd.ncl.edu.tw/handle/71789977958480601811
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spelling ndltd-TW-082NTHU04420722016-07-18T04:09:49Z http://ndltd.ncl.edu.tw/handle/71789977958480601811 Study of Oxide and Interface Traps in Ultra-Thin Nitrided Oxide MOSFET Using Hot-Carrier Injection from a Buried Junction Injector 利用埋藏式結構之熱載子注入法研究摻氮之超薄氧化層及介面陷阱之產生機構 Shih-wei Tsai 蔡世偉 碩士 國立清華大學 電機工程研究所 82 Charles C.C. Hsu 徐清祥 1994 學位論文 ; thesis 0 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立清華大學 === 電機工程研究所 === 82 ===
author2 Charles C.C. Hsu
author_facet Charles C.C. Hsu
Shih-wei Tsai
蔡世偉
author Shih-wei Tsai
蔡世偉
spellingShingle Shih-wei Tsai
蔡世偉
Study of Oxide and Interface Traps in Ultra-Thin Nitrided Oxide MOSFET Using Hot-Carrier Injection from a Buried Junction Injector
author_sort Shih-wei Tsai
title Study of Oxide and Interface Traps in Ultra-Thin Nitrided Oxide MOSFET Using Hot-Carrier Injection from a Buried Junction Injector
title_short Study of Oxide and Interface Traps in Ultra-Thin Nitrided Oxide MOSFET Using Hot-Carrier Injection from a Buried Junction Injector
title_full Study of Oxide and Interface Traps in Ultra-Thin Nitrided Oxide MOSFET Using Hot-Carrier Injection from a Buried Junction Injector
title_fullStr Study of Oxide and Interface Traps in Ultra-Thin Nitrided Oxide MOSFET Using Hot-Carrier Injection from a Buried Junction Injector
title_full_unstemmed Study of Oxide and Interface Traps in Ultra-Thin Nitrided Oxide MOSFET Using Hot-Carrier Injection from a Buried Junction Injector
title_sort study of oxide and interface traps in ultra-thin nitrided oxide mosfet using hot-carrier injection from a buried junction injector
publishDate 1994
url http://ndltd.ncl.edu.tw/handle/71789977958480601811
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AT càishìwěi studyofoxideandinterfacetrapsinultrathinnitridedoxidemosfetusinghotcarrierinjectionfromaburiedjunctioninjector
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AT càishìwěi lìyòngmáicángshìjiégòuzhīrèzàizizhùrùfǎyánjiūcàndànzhīchāobáoyǎnghuàcéngjíjièmiànxiànjǐngzhīchǎnshēngjīgòu
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