The study on photoelastic modulator

碩士 === 國立臺灣大學 === 光電(科學)研究所 === 82 === Spectrocospic ellipsometry is the well-know and powerful optical technique to obtain the optical proerties ,such as dielectric function of metal and semiconductor. In the thesis, we focus our attention...

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Main Authors: Hwang,Te-An, 黃德安
Other Authors: Jan,Guo-Jen
Format: Others
Language:zh-TW
Published: 1994
Online Access:http://ndltd.ncl.edu.tw/handle/43835215318288248839
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spelling ndltd-TW-082NTU001230042016-07-18T04:09:53Z http://ndltd.ncl.edu.tw/handle/43835215318288248839 The study on photoelastic modulator 光彈調制橢球儀之研製 Hwang,Te-An 黃德安 碩士 國立臺灣大學 光電(科學)研究所 82 Spectrocospic ellipsometry is the well-know and powerful optical technique to obtain the optical proerties ,such as dielectric function of metal and semiconductor. In the thesis, we focus our attention on system setup technique. In electronical signal , we successfully divide ac and dc components of signal by buffer and establish signal processing structure . We also use electronic servo amplifier and negative high voltage power supply made by our laboratory to normalize the signal. In optical element , we analysis the photoelastic modulator deviation from ideal by modified models and how to solve it. In final we discuss why the calibration results not equal to the theory and error sources by measureing Si bulk material. Jan,Guo-Jen 詹國禎 1994 學位論文 ; thesis 71 zh-TW
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description 碩士 === 國立臺灣大學 === 光電(科學)研究所 === 82 === Spectrocospic ellipsometry is the well-know and powerful optical technique to obtain the optical proerties ,such as dielectric function of metal and semiconductor. In the thesis, we focus our attention on system setup technique. In electronical signal , we successfully divide ac and dc components of signal by buffer and establish signal processing structure . We also use electronic servo amplifier and negative high voltage power supply made by our laboratory to normalize the signal. In optical element , we analysis the photoelastic modulator deviation from ideal by modified models and how to solve it. In final we discuss why the calibration results not equal to the theory and error sources by measureing Si bulk material.
author2 Jan,Guo-Jen
author_facet Jan,Guo-Jen
Hwang,Te-An
黃德安
author Hwang,Te-An
黃德安
spellingShingle Hwang,Te-An
黃德安
The study on photoelastic modulator
author_sort Hwang,Te-An
title The study on photoelastic modulator
title_short The study on photoelastic modulator
title_full The study on photoelastic modulator
title_fullStr The study on photoelastic modulator
title_full_unstemmed The study on photoelastic modulator
title_sort study on photoelastic modulator
publishDate 1994
url http://ndltd.ncl.edu.tw/handle/43835215318288248839
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