Placement for Reliability and Routability: From Chip to Board Levels Design

博士 === 國立成功大學 === 電機工程研究所 === 83 === This work focuses on the automatic placement for integrated circuits. It covers topics such as printed circuit boards, power hybrid circuits, and integrated circuits such as standard cell, gate matrix, and Weinberger d...

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Bibliographic Details
Main Authors: Jing Lee, 黎靖
Other Authors: Shen-Li Fu, Jung-Hua Chou
Format: Others
Language:en_US
Published: 1995
Online Access:http://ndltd.ncl.edu.tw/handle/55523888628123395472
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Summary:博士 === 國立成功大學 === 電機工程研究所 === 83 === This work focuses on the automatic placement for integrated circuits. It covers topics such as printed circuit boards, power hybrid circuits, and integrated circuits such as standard cell, gate matrix, and Weinberger designs. In addition, thermal management technology and reliability prediction also are considered. All of the algorithms presented in this study are based on hypergraph structures. For chip level placements, one- dimensional approaches are presented for different layout styles. The presented methods can munimize the maximum routing density of placements, thus obtain high quality results. A hierarchical placement procedure is developed to take care of both reliability and wireability for hybrid circuits. Results indicate that our method can distribute the temperature profile on the substrate more uniformly and thus improves the system reliability. Following the reliability improvement the wireability only degrades slightly. For board level placement, a placement scheme which couples both wireability and reliability for convectively cooled boards is presented. An ordered best-first search algorithm is presented for solving the two-objective optimization problem. The first solution obtained by the algorithm has very high quality in system failure rates. This is very important especially for large- sized problems, since it infers that one can obtan high quality solutions with less computation time.