The Design of Production Activity Control Policy for Wafer Fabrication Factory

碩士 === 國立交通大學 === 工業工程研究所 === 83 === The system throughput of the wafer fabrication is limited by the machine capacity and the random variations from the machine breakdowns. Therefore, the main goal of the production activity control is to fully utilize t...

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Main Authors: H. W. Wrang, 黃宏文
Other Authors: S. H. Chung
Format: Others
Language:zh-TW
Published: 1995
Online Access:http://ndltd.ncl.edu.tw/handle/17511609362495206713
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spelling ndltd-TW-083NCTU00300302015-10-13T12:53:37Z http://ndltd.ncl.edu.tw/handle/17511609362495206713 The Design of Production Activity Control Policy for Wafer Fabrication Factory 晶圓製造廠生產作業控制策略之構建 H. W. Wrang 黃宏文 碩士 國立交通大學 工業工程研究所 83 The system throughput of the wafer fabrication is limited by the machine capacity and the random variations from the machine breakdowns. Therefore, the main goal of the production activity control is to fully utilize the capacity of the constraint resource. And the secondary goal is to low down the WIP level in the shop floor and the production flow time. To design the control policy for a wafer fabrication factory, this thesis first constructs the policy selection analysis. It identifies the basic factors of the production control policy, including the utilization rate of capacity constraint resource(CCR), reentry characteristies, WIP control, and machine breakdown. According to these factors, twelve material release rules are studied and compared to find out the relationships and differences. The results show that the starvation avoidance (SA) rule, developed by Glassey & Resende[4], meets the control goals the most. As a result, this thesis try to combine the concepts of the SA rule and the WIP Control rule to develop the production activity control model for wafer fabrication factory. For the material release, this control model establish the safety WIP level, the WIP threshold values between two consecutive operation layers, and the cumulative release threshold values to control the material release process. For the dispatching, this model considers whether or not the operation station is the CCR, and the CCR is in starvation state or not. Besides, the dispatching model considers the balancing of the WIP level for each operation layer of every product. It also considers the priority difference among orders. The experience studies show that the capacity of the CCR is fully utilized when applying the developed model. The results also show that the model has high performance in mean value and standard deviation in the following measures : the throughput rate, the flow time of products, the queue time, and the WIP level. S. H. Chung 鍾淑馨 1995 學位論文 ; thesis 123 zh-TW
collection NDLTD
language zh-TW
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description 碩士 === 國立交通大學 === 工業工程研究所 === 83 === The system throughput of the wafer fabrication is limited by the machine capacity and the random variations from the machine breakdowns. Therefore, the main goal of the production activity control is to fully utilize the capacity of the constraint resource. And the secondary goal is to low down the WIP level in the shop floor and the production flow time. To design the control policy for a wafer fabrication factory, this thesis first constructs the policy selection analysis. It identifies the basic factors of the production control policy, including the utilization rate of capacity constraint resource(CCR), reentry characteristies, WIP control, and machine breakdown. According to these factors, twelve material release rules are studied and compared to find out the relationships and differences. The results show that the starvation avoidance (SA) rule, developed by Glassey & Resende[4], meets the control goals the most. As a result, this thesis try to combine the concepts of the SA rule and the WIP Control rule to develop the production activity control model for wafer fabrication factory. For the material release, this control model establish the safety WIP level, the WIP threshold values between two consecutive operation layers, and the cumulative release threshold values to control the material release process. For the dispatching, this model considers whether or not the operation station is the CCR, and the CCR is in starvation state or not. Besides, the dispatching model considers the balancing of the WIP level for each operation layer of every product. It also considers the priority difference among orders. The experience studies show that the capacity of the CCR is fully utilized when applying the developed model. The results also show that the model has high performance in mean value and standard deviation in the following measures : the throughput rate, the flow time of products, the queue time, and the WIP level.
author2 S. H. Chung
author_facet S. H. Chung
H. W. Wrang
黃宏文
author H. W. Wrang
黃宏文
spellingShingle H. W. Wrang
黃宏文
The Design of Production Activity Control Policy for Wafer Fabrication Factory
author_sort H. W. Wrang
title The Design of Production Activity Control Policy for Wafer Fabrication Factory
title_short The Design of Production Activity Control Policy for Wafer Fabrication Factory
title_full The Design of Production Activity Control Policy for Wafer Fabrication Factory
title_fullStr The Design of Production Activity Control Policy for Wafer Fabrication Factory
title_full_unstemmed The Design of Production Activity Control Policy for Wafer Fabrication Factory
title_sort design of production activity control policy for wafer fabrication factory
publishDate 1995
url http://ndltd.ncl.edu.tw/handle/17511609362495206713
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