Generation and Application of Universal Test Sets
博士 === 國立交通大學 === 電子研究所 === 83 === In the dissertation, the generation and application of universal test sets (UTS) are studied and discussed. (1) We propose fast algorithms to generate the UTS for different fault models for combinational function blocks....
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
1995
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| Online Access: | http://ndltd.ncl.edu.tw/handle/40837976077440535703 |