Testing and Built-in Self Test Methodology of Partially Scanned MCM Interconnects
碩士 === 國立中央大學 === 電機工程研究所 === 83 === In this thesis, we will present syndrome test for partially scanned MCM. We will do a detail mathematical analysis of syndro me testing. There are two issues in syndrome testing, one is tes t hardware structure another...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1995
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| Online Access: | http://ndltd.ncl.edu.tw/handle/78032581382224678611 |