Distribution Feeder High Impedance Fault Detection and Staged Fault Test

碩士 === 國立清華大學 === 電機工程研究所 === 83 === The 11.4KV covered conductor fallen on the ground or the 11.4KV bare conductor fallen on the high resistance ground can cause the high impedance fault ( HIF ). Because their fault current is low , the co...

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Bibliographic Details
Main Authors: Chih-Kan Teng, 鄧志淦
Other Authors: SHI-LIN CHEN
Format: Others
Language:zh-TW
Published: 1995
Online Access:http://ndltd.ncl.edu.tw/handle/05032215774604960230
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Summary:碩士 === 國立清華大學 === 電機工程研究所 === 83 === The 11.4KV covered conductor fallen on the ground or the 11.4KV bare conductor fallen on the high resistance ground can cause the high impedance fault ( HIF ). Because their fault current is low , the conventional overcurrent ( CO ) and low energy overcurrent ( LCO ) relays have difficulty in detecting the fault . This 11.4KV conductor on the ground may cause fire hazard or human accident. Our research studies the detection algorithms to detect the HIF. The major contributions of our research are:(1) We design a relay setting scheme to improve seven well-known detection algorithms developed by previous researchers, and test the scheme numerically. The test results show that our scheme can enhance the detection accuracy significantly. (2) We propose a new detection algorithm which detects the HIF on basis of the summed variance of the second, fourth and sixth harmonics of feeder current. Combined with our automatic relay setting scheme, this new algorithm is generally superior, in terms of detection accuracy, to the above well- known seven algorithms. 3) We conduct the staged HIF three times, jointly with the Taiwan Power (Taipower) engineers, to test the HIF detector developed in this research. The field testing items include the switching of feeder capacitors, the switching of a load break switch for a normally loaded lateral, and the HIF.]4) The testing results of the detector are satisfactory. (5) We further modify the above lower-order harmonics variance detection algorithm so that the algorithm can detect not only the HIF but also the very high impedance fault whose fault current approaches zero.