Testing bisimulation equivalence, trace equivalence, and various fairness properties for concurrent systems

碩士 === 國立臺灣大學 === 電機工程學研究所 === 83 ===

Bibliographic Details
Main Authors: Jian, Xi Cun, 簡西村
Other Authors: Yan, Si Jun
Format: Others
Language:zh-TW
Published: 1995
Online Access:http://ndltd.ncl.edu.tw/handle/63468014741299869342

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