The study of the brightness degradation and its mechanism in AC thin-film electroluminescent devices

The study of the brightness degradation and its mechanism in AC thin-film electroluminescent devices

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碩士 === 高雄工學院 === 電機工程研究所 === 84 ===

Bibliographic Details
Main Authors: Xu, Cong Ji, 許聰基
Other Authors: Wang, Qin Wu
Format: Others
Language:zh-TW
Published: 1996
Online Access:http://ndltd.ncl.edu.tw/handle/77469778317887866836
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spelling ndltd-TW-084ISU024420052015-10-13T12:28:53Z http://ndltd.ncl.edu.tw/handle/77469778317887866836 The study of the brightness degradation and its mechanism in AC thin-film electroluminescent devices 交流薄膜電激發光元件亮度衰減機制之研究 Xu, Cong Ji 許聰基 碩士 高雄工學院 電機工程研究所 84 Wang, Qin Wu Su, Yan Kun 王欽戊 蘇炎坤 1996 學位論文 ; thesis 0 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 高雄工學院 === 電機工程研究所 === 84 ===
author2 Wang, Qin Wu
author_facet Wang, Qin Wu
Xu, Cong Ji
許聰基
author Xu, Cong Ji
許聰基
spellingShingle Xu, Cong Ji
許聰基
The study of the brightness degradation and its mechanism in AC thin-film electroluminescent devices
author_sort Xu, Cong Ji
title The study of the brightness degradation and its mechanism in AC thin-film electroluminescent devices
title_short The study of the brightness degradation and its mechanism in AC thin-film electroluminescent devices
title_full The study of the brightness degradation and its mechanism in AC thin-film electroluminescent devices
title_fullStr The study of the brightness degradation and its mechanism in AC thin-film electroluminescent devices
title_full_unstemmed The study of the brightness degradation and its mechanism in AC thin-film electroluminescent devices
title_sort study of the brightness degradation and its mechanism in ac thin-film electroluminescent devices
publishDate 1996
url http://ndltd.ncl.edu.tw/handle/77469778317887866836
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