The study of the brightness degradation and its mechanism in AC thin-film electroluminescent devices
碩士 === 高雄工學院 === 電機工程研究所 === 84 ===
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1996
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Online Access: | http://ndltd.ncl.edu.tw/handle/77469778317887866836 |
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ndltd-TW-084ISU024420052015-10-13T12:28:53Z http://ndltd.ncl.edu.tw/handle/77469778317887866836 The study of the brightness degradation and its mechanism in AC thin-film electroluminescent devices 交流薄膜電激發光元件亮度衰減機制之研究 Xu, Cong Ji 許聰基 碩士 高雄工學院 電機工程研究所 84 Wang, Qin Wu Su, Yan Kun 王欽戊 蘇炎坤 1996 學位論文 ; thesis 0 zh-TW |
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zh-TW |
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碩士 === 高雄工學院 === 電機工程研究所 === 84 ===
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author2 |
Wang, Qin Wu |
author_facet |
Wang, Qin Wu Xu, Cong Ji 許聰基 |
author |
Xu, Cong Ji 許聰基 |
spellingShingle |
Xu, Cong Ji 許聰基 The study of the brightness degradation and its mechanism in AC thin-film electroluminescent devices |
author_sort |
Xu, Cong Ji |
title |
The study of the brightness degradation and its mechanism in AC thin-film electroluminescent devices |
title_short |
The study of the brightness degradation and its mechanism in AC thin-film electroluminescent devices |
title_full |
The study of the brightness degradation and its mechanism in AC thin-film electroluminescent devices |
title_fullStr |
The study of the brightness degradation and its mechanism in AC thin-film electroluminescent devices |
title_full_unstemmed |
The study of the brightness degradation and its mechanism in AC thin-film electroluminescent devices |
title_sort |
study of the brightness degradation and its mechanism in ac thin-film electroluminescent devices |
publishDate |
1996 |
url |
http://ndltd.ncl.edu.tw/handle/77469778317887866836 |
work_keys_str_mv |
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