Study on the Characteristics and Reliability of Hydrogenated Amorphous Silicon Thin Film Transistors

Study on the Characteristics and Reliability of Hydrogenated Amorphous Silicon Thin Film Transistors

博士 === 國立交通大學 === 電子研究所 === 84 === This thesis presents the factors which can affect the characteristics of the hydrogenated amorphous silicon (a-Si :H) thin film transistors (TFTs), including the gate dielectrics the a-Si:H film, and interfaces, etc. The...

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Bibliographic Details
Main Authors:	Tai ,Ya-Hsiang, 戴亞翔
Other Authors:	Huang-Chung Cheng
Format:	Others
Language:	en_US
Published:	1996
Online Access:	http://ndltd.ncl.edu.tw/handle/87684650807008693742

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