A Circuit Simulation and Analysis on High Speed DRAM

碩士 === 國立中山大學 === 電機工程研究所 === 84 === In this thesis, a DRAM circuit was developed for our simulation. Each subcircuit in the system was discussed. In our circuit, we design a control circuit for bit-line eqivalence precharge, it includes an...

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Main Authors: Chen, Jin Woon, 陳景文
Other Authors: Lin, Jyi Tsong
Format: Others
Language:zh-TW
Published: 1996
Online Access:http://ndltd.ncl.edu.tw/handle/68875611408461710635
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spelling ndltd-TW-084NSYSU4420572015-10-13T14:34:59Z http://ndltd.ncl.edu.tw/handle/68875611408461710635 A Circuit Simulation and Analysis on High Speed DRAM 高速度動態隨機存取記憶體之線路模擬與分析 Chen, Jin Woon 陳景文 碩士 國立中山大學 電機工程研究所 84 In this thesis, a DRAM circuit was developed for our simulation. Each subcircuit in the system was discussed. In our circuit, we design a control circuit for bit-line eqivalence precharge, it includes an address transition detection circuit in it to detect the voltage transition on bit-lines. A word- line buffer was also designed to ensure the precharging sequence. It latches the add- ress during precharge cycle and generate the word-lines after precharge. For sensing speed consideration, we adopted a readout amplifier with current sensing type, which has higher gain and speed than that with voltage sensing type. Our circuit also in- cluded a sense- restore amplifier with barrier transistors, which reduces the sensing time by about 2.5 ns. Lin, Jyi Tsong 林吉聰 1996 學位論文 ; thesis 62 zh-TW
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language zh-TW
format Others
sources NDLTD
description 碩士 === 國立中山大學 === 電機工程研究所 === 84 === In this thesis, a DRAM circuit was developed for our simulation. Each subcircuit in the system was discussed. In our circuit, we design a control circuit for bit-line eqivalence precharge, it includes an address transition detection circuit in it to detect the voltage transition on bit-lines. A word- line buffer was also designed to ensure the precharging sequence. It latches the add- ress during precharge cycle and generate the word-lines after precharge. For sensing speed consideration, we adopted a readout amplifier with current sensing type, which has higher gain and speed than that with voltage sensing type. Our circuit also in- cluded a sense- restore amplifier with barrier transistors, which reduces the sensing time by about 2.5 ns.
author2 Lin, Jyi Tsong
author_facet Lin, Jyi Tsong
Chen, Jin Woon
陳景文
author Chen, Jin Woon
陳景文
spellingShingle Chen, Jin Woon
陳景文
A Circuit Simulation and Analysis on High Speed DRAM
author_sort Chen, Jin Woon
title A Circuit Simulation and Analysis on High Speed DRAM
title_short A Circuit Simulation and Analysis on High Speed DRAM
title_full A Circuit Simulation and Analysis on High Speed DRAM
title_fullStr A Circuit Simulation and Analysis on High Speed DRAM
title_full_unstemmed A Circuit Simulation and Analysis on High Speed DRAM
title_sort circuit simulation and analysis on high speed dram
publishDate 1996
url http://ndltd.ncl.edu.tw/handle/68875611408461710635
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