IEEE Std. 1149.5 MTM-Bus Slave Module Chip Design and Its Application to Hierarchical System Test
碩士 === 國立清華大學 === 電機工程研究所 === 84 ===
Main Authors: | Cai, Zhong-Hong, 蔡忠宏 |
---|---|
Other Authors: | Wu, Cheng-Wen |
Format: | Others |
Language: | zh-TW |
Published: |
1996
|
Online Access: | http://ndltd.ncl.edu.tw/handle/74643245065749679703 |
Similar Items
-
IEEE Std. 1149.4 Compatible Analog BIST Methodology
by: Te-Sung, Tu, et al.
Published: (2004) -
A Test Chip for IEEE P1149.4 Analog Test Bus
by: Hwang Shih Te, et al.
Published: (1996) -
Utökade tester enligt IEEE std 1149.1-2001 för Main Switch Board
by: Andersson, David
Published: (2005) -
Complete Interconnect BIST Using IEEE 1149 Boundary Scan
by: Jane, Shaing-Wang, et al.
Published: (1997) -
RSA Public Key Crypto-Processor Core Design and Hierarchical System Test Using IEEE 1149 Family
by: Jin-Hua Hong, et al.
Published: (2000)