A new technique to characterize stress induced low-level leakage current in flash EEPROM cells

碩士 === 國立交通大學 === 電子工程學系 === 85 === In this thesis, we proposed a novel two-phase subthreshold transient current measurement method and an analytical model to characterize the stress induced low-level leakage current (SILC) in a flash...

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Bibliographic Details
Main Authors: Wang, Chih-Hung, 王智弘
Other Authors: Tahui Wang
Format: Others
Language:zh-TW
Published: 1997
Online Access:http://ndltd.ncl.edu.tw/handle/72120740893760197961