A new technique to characterize stress induced low-level leakage current in flash EEPROM cells
碩士 === 國立交通大學 === 電子工程學系 === 85 === In this thesis, we proposed a novel two-phase subthreshold transient current measurement method and an analytical model to characterize the stress induced low-level leakage current (SILC) in a flash...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
1997
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| Online Access: | http://ndltd.ncl.edu.tw/handle/72120740893760197961 |