Characteristics of ZnSe Films Grown by cw CO2 Laser with Ion Beam-assisted Deposition

碩士 === 國立交通大學 === 電子物理系 === 86 ===   Znse films were grown on quartzs and GaAs (100) substrates by cw CO2 laser with ion beam-assisted deposition. The films grown on quartz substrates were the zinc-blende polycrystalline structure with a strong preferred [111] orientation, even deposited on room tep...

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Main Authors: Tseng, Hsiang-Ming, 曾祥明
Other Authors: Lee, Ming-Chih
Format: Others
Language:zh-TW
Published: 1998
Online Access:http://ndltd.ncl.edu.tw/handle/58132523556246512672
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spelling ndltd-TW-086NCTU34290152015-10-13T11:06:15Z http://ndltd.ncl.edu.tw/handle/58132523556246512672 Characteristics of ZnSe Films Grown by cw CO2 Laser with Ion Beam-assisted Deposition 以離子束輔助連續式二氧化碳雷射蒸鍍技術成長硒化鋅薄膜之特性研 Tseng, Hsiang-Ming 曾祥明 碩士 國立交通大學 電子物理系 86   Znse films were grown on quartzs and GaAs (100) substrates by cw CO2 laser with ion beam-assisted deposition. The films grown on quartz substrates were the zinc-blende polycrystalline structure with a strong preferred [111] orientation, even deposited on room teperature substrates.Without ion beam assistance, the film grown at a substrate temperature 150℃, a growth rate 6.4 A/sec had the best properties which the refractive index was 2, 5218, the extinction coefficient was 0.0016 at 700 nm and the peel strength was 11.44 mN. With ion beam assistance, the film grown at a ion beam voltage 200V, a ion beam current 15 mA was the best one whose refractive index was 2.536 close to single crystal ZnSe bulk 2.6540, extinction coefficient was 0.0010 and peel strength was 16.9 mN. From Raman measurements, the stress between the ZnSe film and the quartz substrate was 1.27×1013 dyn cm-2 We found that the properties of polycrystalline ZnSe films prepared by the system we used were better then those by the traditional thermal and electron beam evaporation.   When the substrate temperature was above 200℃, the ZnSe film grown on a GaAs (100) substrate became a single crystal. By the way, we found that the low energy ion beam could remove the oxide covering over the GaAs substrate surface. Raman measurements showed that the stress between the film grown at 400℃ and the Ga As (100) substrate was smallest and the film transmittance to 488 nm laser beam was highest. According to spatial correlation model of Raman scattering, the coherence length (L=16.5 nm) of the film grown at 350℃ was longest. PL of the film grown at 400℃ was gotten. The low temperature (T=20K) PL showed that the energy of the donor-bound exciton (I2) transition was 2.795 eV and the FWHM was 7.6 meV. From PL measurements at different temperatures, the linear temperature coefficient of I2 was-4.3×10-4 eV K-1 and the activation energy was 25 meV. Lee, Ming-Chih Chen, Jyh-Shin 李明知 陳至信 1998 學位論文 ; thesis 75 zh-TW
collection NDLTD
language zh-TW
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sources NDLTD
description 碩士 === 國立交通大學 === 電子物理系 === 86 ===   Znse films were grown on quartzs and GaAs (100) substrates by cw CO2 laser with ion beam-assisted deposition. The films grown on quartz substrates were the zinc-blende polycrystalline structure with a strong preferred [111] orientation, even deposited on room teperature substrates.Without ion beam assistance, the film grown at a substrate temperature 150℃, a growth rate 6.4 A/sec had the best properties which the refractive index was 2, 5218, the extinction coefficient was 0.0016 at 700 nm and the peel strength was 11.44 mN. With ion beam assistance, the film grown at a ion beam voltage 200V, a ion beam current 15 mA was the best one whose refractive index was 2.536 close to single crystal ZnSe bulk 2.6540, extinction coefficient was 0.0010 and peel strength was 16.9 mN. From Raman measurements, the stress between the ZnSe film and the quartz substrate was 1.27×1013 dyn cm-2 We found that the properties of polycrystalline ZnSe films prepared by the system we used were better then those by the traditional thermal and electron beam evaporation.   When the substrate temperature was above 200℃, the ZnSe film grown on a GaAs (100) substrate became a single crystal. By the way, we found that the low energy ion beam could remove the oxide covering over the GaAs substrate surface. Raman measurements showed that the stress between the film grown at 400℃ and the Ga As (100) substrate was smallest and the film transmittance to 488 nm laser beam was highest. According to spatial correlation model of Raman scattering, the coherence length (L=16.5 nm) of the film grown at 350℃ was longest. PL of the film grown at 400℃ was gotten. The low temperature (T=20K) PL showed that the energy of the donor-bound exciton (I2) transition was 2.795 eV and the FWHM was 7.6 meV. From PL measurements at different temperatures, the linear temperature coefficient of I2 was-4.3×10-4 eV K-1 and the activation energy was 25 meV.
author2 Lee, Ming-Chih
author_facet Lee, Ming-Chih
Tseng, Hsiang-Ming
曾祥明
author Tseng, Hsiang-Ming
曾祥明
spellingShingle Tseng, Hsiang-Ming
曾祥明
Characteristics of ZnSe Films Grown by cw CO2 Laser with Ion Beam-assisted Deposition
author_sort Tseng, Hsiang-Ming
title Characteristics of ZnSe Films Grown by cw CO2 Laser with Ion Beam-assisted Deposition
title_short Characteristics of ZnSe Films Grown by cw CO2 Laser with Ion Beam-assisted Deposition
title_full Characteristics of ZnSe Films Grown by cw CO2 Laser with Ion Beam-assisted Deposition
title_fullStr Characteristics of ZnSe Films Grown by cw CO2 Laser with Ion Beam-assisted Deposition
title_full_unstemmed Characteristics of ZnSe Films Grown by cw CO2 Laser with Ion Beam-assisted Deposition
title_sort characteristics of znse films grown by cw co2 laser with ion beam-assisted deposition
publishDate 1998
url http://ndltd.ncl.edu.tw/handle/58132523556246512672
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