Fabrication and Measurement of Single Electron Tunneling Transistor

碩士 === 國立臺灣大學 === 電機工程學研究所 === 87 === This thesis is to use E-beam lithography to fabricate Single Electron Tunneling (SET) transistor and study single electron tunneling phenomena of nanostructure under Coulomb Blockcade effect. The feature, electron transport in the SET devices one by o...

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Bibliographic Details
Main Authors: SHEN-CHING SUN, 孫聖景
Other Authors: Chieh-Hsiung Kuan
Format: Others
Language:en_US
Published: 1999
Online Access:http://ndltd.ncl.edu.tw/handle/44456505617474430981

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