A Study of Shallow Junction Formation by Using Low Thermal Budget

碩士 === 國立臺灣科技大學 === 電子工程系 === 87 === The scaling of CMOS devices to satisfy deep submicrometer technology requirements involves several process adjustments . One of the main challenges is the formation of shallow junction . Low-energy ion implantation , in tandem with low-thermal budget a...

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Bibliographic Details
Main Authors: Shyh-Chyang Harn, 韓士強
Other Authors: Miin-Horng Juang
Format: Others
Language:en_US
Published: 1999
Online Access:http://ndltd.ncl.edu.tw/handle/78378584814180772272