Investigation of Leakage Phenomena in Multilayered Microstrip-Like Structrues Using Spectral Domain Approach

碩士 === 國立臺北科技大學 === 電腦通訊與控制研究所 === 87 === In recent years microwave integrated circuits have been operated at higher and higher frequencies. Usually most transmission structures will leak power into surface waves at sufficiently high frequencies. Of significant concern is the dominant lea...

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Bibliographic Details
Main Authors: Jent-Shung Lu, 盧正雄
Other Authors: Cheng-Cheh Yu
Format: Others
Language:en_US
Published: 1999
Online Access:http://ndltd.ncl.edu.tw/handle/16543883390804190613
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Summary:碩士 === 國立臺北科技大學 === 電腦通訊與控制研究所 === 87 === In recent years microwave integrated circuits have been operated at higher and higher frequencies. Usually most transmission structures will leak power into surface waves at sufficiently high frequencies. Of significant concern is the dominant leaky mode, this phenomenon will cause interference between neighboring portions of the circuits. The system performance will thus be deteriorated. When leakage occurs, the guided wavenumber will become a complex value. The surface wave leakage will take place in lateral directions. In this thesis leakage phenomena in multilayered microstrip-like structures are investigated using spectral domain technique. Based on spectral domain analysis all numerical results are obtained via a general formulation in which both longitudinal and transverse current components on the conducting strip are taken into consideration. The dominant leaky mode solution is then successfully obtained by choosing appropriate complex integration contours that detours around the TM0 surface wave poles of all the integrands.