Performance Measurement on Quality Assurance System

碩士 === 逢甲大學 === 工業工程學系 === 88 === Abstract No matter what the production system is automatic or semi-automatic, the variation in production quality still exits that caused from the technology, experience, materials, operator, and process variation, etc. Therefore, it is necessary to allo...

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Bibliographic Details
Main Authors: Hong-Chi Jwang, 莊泓錡
Other Authors: Yau-Ren Shiau
Format: Others
Language:zh-TW
Published: 2000
Online Access:http://ndltd.ncl.edu.tw/handle/69917652132810949545
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Summary:碩士 === 逢甲大學 === 工業工程學系 === 88 === Abstract No matter what the production system is automatic or semi-automatic, the variation in production quality still exits that caused from the technology, experience, materials, operator, and process variation, etc. Therefore, it is necessary to allocate inspection stations among workstations. The production efficiency and the relative cost then can be improved and reduced, respectively. However, the performance of inspection systems should be evaluated for allocating the inspection resource. Based on the limited inspection resource, the way to evaluate the performance of inspection station allocation was developed in this research. Instead of ambiguous index, the expected total cost was studied to distinctly measure the performance. Then, a feasible inspection allocation plan can be determined. Under the consideration of manufacturing cost, quality inspection cost, internal failure cost and external failure cost, the relative cost models was constructed by considering both the process capability and the measurement capability. To obtain a feasible inspection allocation plan, total enumeration method (TEM) is used to get the global optimal solution of the mathematical model. However, the larger the problem size is the more the computational time is. Thus, a heuristic solution method, sequential assignment method (SAM), has been developed to reduce the time of solution. The result shows that it is effective to obtain a near optimal solution with great savings in computational time when compared with TEM.