To Construct A New Reliability Growth Test Plan with Cost Consideration
碩士 === 義守大學 === 管理科學研究所 === 89 === ABSTRACT This paper focuses on discussing a reliability growth evaluation plan applied to the reliability growth model in a complex system. And a cost model of Reliability growth test plan are proposed . “Non-delayed Fixes（NDF）and Delayed Fixe...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2001
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| Online Access: | http://ndltd.ncl.edu.tw/handle/78183208652134779188 |
| Summary: | 碩士 === 義守大學 === 管理科學研究所 === 89 === ABSTRACT
This paper focuses on discussing a reliability growth evaluation plan applied to the reliability growth model in a complex system. And a cost model of Reliability growth test plan are proposed . “Non-delayed Fixes（NDF）and Delayed Fixes（DF）”are two types of fix policy for any failure occurred. Both the Kalman Filter principle and the combined model of Chu-Bayes are used for the NDF / DF policy change problem in order to solve a cost optimization problem and to determine the proper time for starting DF of our model. In this paper，We also present a case study of applying the evaluation plan to the XM product development in some factories. And the result shows that the proposed model works well.
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