電子斑點干涉術於微變形量測及其影像後處理之研究
碩士 === 國立中興大學 === 機械工程學系 === 89 === ABSTRACT Speckle interferometry techniques have been in use for many years, especially, electronic speckle pattern interferometry (ESPI) recently. However, several common problems still exist and are needed to be improved. In this thesis, several techni...
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| Format: | Others |
| Language: | zh-TW |
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2001
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| Online Access: | http://ndltd.ncl.edu.tw/handle/96082714365494699908 |