| Summary: | 碩士 === 國防大學中正理工學院 === 電子工程研究所 === 90 === A nuclear burst generates an intense electromagnetic pulse (EMP), which can reach the peak field strength of several ten kilovolts per meter within nanoseconds. The fields can propagate directly through building, or they can couple to exterior terminals (power lines, cables, antennas, etc.) and penetrate the facility. EMP fields always induce large current and voltage transients, which might cause damage or threaten sensitive electronic equipment.
EMP surges tend to exhibit shorter durations and steeper wavefronts, such that circuit breakers and fuses may not response quickly enough. Special protection devices may thus be necessary. In general, protection devices are referred to voltage-or current limiters, which include diodes, varistors, spark gap and transient voltage suppressors (TVS). This thesis discuss EMP protection for communication equipment and testing the protection devices that may be used to protect susceptible components and circuits against EMP-induced transients by ESD models and EMP parallel plate simulator.
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