The study of ESD protection circuit in deep submicron CMOS and RF circuits
碩士 === 國立清華大學 === 電子工程研究所 === 90 === In order to ensure IC products can go to the market smoothly and on time, function faultless and reliability are very important. But as we know, the key point is if they can pass ESD testing or not. Although some advanced processes help prompting IC...
Main Authors: | Ming Chu Chien, 簡旻助 |
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Other Authors: | Chenhsin Lien |
Format: | Others |
Language: | zh-TW |
Published: |
2002
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Online Access: | http://ndltd.ncl.edu.tw/handle/48305409296750658216 |
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