Sn-3.5Ag銲錫球格陣列構裝接點之高溫機械性質分析
碩士 === 中華大學 === 機械與航太工程研究所 === 91 === In this study, the fracture behaviors of the eutectic Sn-3.5Ag ball-grid array assembly have been evaluated by tensile testing at strain rates of 10-4, 10-5 and 10-6 s-1 at various homologous temperatures. The tensile strength of eutectic Sn-3.5Ag ball-grid arra...
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ndltd-TW-091CHPI05980442016-06-24T04:16:12Z http://ndltd.ncl.edu.tw/handle/30143242089098066841 Sn-3.5Ag銲錫球格陣列構裝接點之高溫機械性質分析 J. T. Chiang 江榮泰 碩士 中華大學 機械與航太工程研究所 91 In this study, the fracture behaviors of the eutectic Sn-3.5Ag ball-grid array assembly have been evaluated by tensile testing at strain rates of 10-4, 10-5 and 10-6 s-1 at various homologous temperatures. The tensile strength of eutectic Sn-3.5Ag ball-grid array assembly was higher than that of bulk Sn-3.5Ag solder, which might be attributed to the geometric constraining effect of the Sn-Ag solder/Cu interfaces. Two typesof fracture modes were fround during the tensile tests depending on the strain rates and homologous temperatures. At a strain rate of 10-4 s-1 and homologous temperatures lower than 0.65, the main crack propagation occurred at the angle 45° with the tensile axis and along the Ag3Sn/Sn interfaces. However, at strain rates lower than 10-4 s-1 and/or at homologous temperatures higher than 0.65, the tensile crack link-up by the creep voids propagated normal to the tensile axis. A transgranular creep fracture was found on the failed surfaces of Sn-3.5Ag ball-grid array assemblies. M. S. Yeh 葉明勳 2003 學位論文 ; thesis 49 zh-TW |
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碩士 === 中華大學 === 機械與航太工程研究所 === 91 === In this study, the fracture behaviors of the eutectic Sn-3.5Ag ball-grid array assembly have been evaluated by tensile testing at strain rates of 10-4, 10-5 and 10-6 s-1 at various homologous temperatures. The tensile strength of eutectic Sn-3.5Ag ball-grid array assembly was higher than that of bulk Sn-3.5Ag solder, which might be attributed to the geometric constraining effect of the Sn-Ag solder/Cu interfaces. Two typesof fracture modes were fround during the tensile tests depending on the strain rates and homologous temperatures. At a strain rate of 10-4 s-1 and homologous temperatures lower than 0.65, the main crack propagation occurred at the angle 45° with the tensile axis and along the Ag3Sn/Sn interfaces. However, at strain rates lower than 10-4 s-1 and/or at homologous temperatures higher than 0.65, the tensile crack link-up by the creep voids propagated normal to the tensile axis. A transgranular creep fracture was found on the failed surfaces of Sn-3.5Ag ball-grid array assemblies.
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author2 |
M. S. Yeh |
author_facet |
M. S. Yeh J. T. Chiang 江榮泰 |
author |
J. T. Chiang 江榮泰 |
spellingShingle |
J. T. Chiang 江榮泰 Sn-3.5Ag銲錫球格陣列構裝接點之高溫機械性質分析 |
author_sort |
J. T. Chiang |
title |
Sn-3.5Ag銲錫球格陣列構裝接點之高溫機械性質分析 |
title_short |
Sn-3.5Ag銲錫球格陣列構裝接點之高溫機械性質分析 |
title_full |
Sn-3.5Ag銲錫球格陣列構裝接點之高溫機械性質分析 |
title_fullStr |
Sn-3.5Ag銲錫球格陣列構裝接點之高溫機械性質分析 |
title_full_unstemmed |
Sn-3.5Ag銲錫球格陣列構裝接點之高溫機械性質分析 |
title_sort |
sn-3.5ag銲錫球格陣列構裝接點之高溫機械性質分析 |
publishDate |
2003 |
url |
http://ndltd.ncl.edu.tw/handle/30143242089098066841 |
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