Vibration Analysis of Atomic Force Microscopy Probe
碩士 === 國立成功大學 === 機械工程學系碩博士班 === 91 === The study is to establish the dynamic measuring modes of microprobes of an atomic force microscopy. The forced vibration of a non-uniform beam with the time-dependent elastic boundary conditions, damping and concentrated tip mass is considered. The governing d...
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ndltd-TW-091NCKU54900612016-06-22T04:14:03Z http://ndltd.ncl.edu.tw/handle/88283486170078311211 Vibration Analysis of Atomic Force Microscopy Probe 非接觸式原子力顯微鏡探針振動分析 Kuen-Wey Lin 林昆蔚 碩士 國立成功大學 機械工程學系碩博士班 91 The study is to establish the dynamic measuring modes of microprobes of an atomic force microscopy. The forced vibration of a non-uniform beam with the time-dependent elastic boundary conditions, damping and concentrated tip mass is considered. The governing differential equation and the associated boundary conditions are derived by using the Hamilton’s principle. The non-homogeneous boundary conditions are transformed into homogeneous ones through the procedure of change of dependent variable. A new analytical solution for the system of non-contact mode is derived to solve the problem with nonlinear boundary condition. This method can be generally applied to solve the problems with nonlinear boundary conditions. By utilizing this method, the frequency shift of non-contact mode is investigated. When the microprobe approaches the sample surface, the nonlinear interaction between tip and sample causes a resonant frequency shift of the microprobe. Thus an atomic-scale surface image can be profiled with the frequency shift. Finally, the influence of the parameters on the transient response and the resonant frequency shift are investigated. Sen-Yung Lee 李森墉 2003 學位論文 ; thesis 68 zh-TW |
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碩士 === 國立成功大學 === 機械工程學系碩博士班 === 91 === The study is to establish the dynamic measuring modes of microprobes of an atomic force microscopy. The forced vibration of a non-uniform beam with the time-dependent elastic boundary conditions, damping and concentrated tip mass is considered. The governing differential equation and the associated boundary conditions are derived by using the Hamilton’s principle. The non-homogeneous boundary conditions are transformed into homogeneous ones through the procedure of change of dependent variable. A new analytical solution for the system of non-contact mode is derived to solve the problem with nonlinear boundary condition. This method can be generally applied to solve the problems with nonlinear boundary conditions. By utilizing this method, the frequency shift of non-contact mode is investigated. When the microprobe approaches the sample surface, the nonlinear interaction between tip and sample causes a resonant frequency shift of the microprobe. Thus an atomic-scale surface image can be profiled with the frequency shift. Finally, the influence of the parameters on the transient response and the resonant frequency shift are investigated.
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author2 |
Sen-Yung Lee |
author_facet |
Sen-Yung Lee Kuen-Wey Lin 林昆蔚 |
author |
Kuen-Wey Lin 林昆蔚 |
spellingShingle |
Kuen-Wey Lin 林昆蔚 Vibration Analysis of Atomic Force Microscopy Probe |
author_sort |
Kuen-Wey Lin |
title |
Vibration Analysis of Atomic Force Microscopy Probe |
title_short |
Vibration Analysis of Atomic Force Microscopy Probe |
title_full |
Vibration Analysis of Atomic Force Microscopy Probe |
title_fullStr |
Vibration Analysis of Atomic Force Microscopy Probe |
title_full_unstemmed |
Vibration Analysis of Atomic Force Microscopy Probe |
title_sort |
vibration analysis of atomic force microscopy probe |
publishDate |
2003 |
url |
http://ndltd.ncl.edu.tw/handle/88283486170078311211 |
work_keys_str_mv |
AT kuenweylin vibrationanalysisofatomicforcemicroscopyprobe AT línkūnwèi vibrationanalysisofatomicforcemicroscopyprobe AT kuenweylin fēijiēchùshìyuánzilìxiǎnwēijìngtànzhēnzhèndòngfēnxī AT línkūnwèi fēijiēchùshìyuánzilìxiǎnwēijìngtànzhēnzhèndòngfēnxī |
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