Dispatching Rules for Raising Hit Rate in Wafer Fabs

碩士 === 國立交通大學 === 工業工程與管理系 === 91 === Hit rate, the rate of on-time delivery, recently becomes a very important performance index in semiconductor foundry fabs. Yet, previous studies on lot dispatching focused on some other relevant performance indices, but very few directly focus on the raising on...

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Main Authors: Cheng-Feng Kao, 高正峰
Other Authors: Muh-Cherng Wu
Format: Others
Language:zh-TW
Published: 2003
Online Access:http://ndltd.ncl.edu.tw/handle/54068718018533689007
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spelling ndltd-TW-091NCTU00310352016-06-22T04:14:05Z http://ndltd.ncl.edu.tw/handle/54068718018533689007 Dispatching Rules for Raising Hit Rate in Wafer Fabs 半導體廠提高達交率的派工法則 Cheng-Feng Kao 高正峰 碩士 國立交通大學 工業工程與管理系 91 Hit rate, the rate of on-time delivery, recently becomes a very important performance index in semiconductor foundry fabs. Yet, previous studies on lot dispatching focused on some other relevant performance indices, but very few directly focus on the raising on hit rate. This research aims to develop dispatching algorithms for raising the hit rate of semiconductor fabs. Some popular dispatching rules are first examined by discrete event simulation. Results show that CR (critical ratio) dispatching rule exceeds the others. This research proposes three novel perspectives to enhance the CR dispatching rule. The hit rate performance of the enhanced-CR rules and some significant dispatching rules in literature are compared by simulation, in scenarios varying in product mix and fab loading. Simulation results show that DCR(delay critical ratio), one of the enhanced-CR dispatching rules, outperforms the others. Muh-Cherng Wu 巫木誠 2003 學位論文 ; thesis 41 zh-TW
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description 碩士 === 國立交通大學 === 工業工程與管理系 === 91 === Hit rate, the rate of on-time delivery, recently becomes a very important performance index in semiconductor foundry fabs. Yet, previous studies on lot dispatching focused on some other relevant performance indices, but very few directly focus on the raising on hit rate. This research aims to develop dispatching algorithms for raising the hit rate of semiconductor fabs. Some popular dispatching rules are first examined by discrete event simulation. Results show that CR (critical ratio) dispatching rule exceeds the others. This research proposes three novel perspectives to enhance the CR dispatching rule. The hit rate performance of the enhanced-CR rules and some significant dispatching rules in literature are compared by simulation, in scenarios varying in product mix and fab loading. Simulation results show that DCR(delay critical ratio), one of the enhanced-CR dispatching rules, outperforms the others.
author2 Muh-Cherng Wu
author_facet Muh-Cherng Wu
Cheng-Feng Kao
高正峰
author Cheng-Feng Kao
高正峰
spellingShingle Cheng-Feng Kao
高正峰
Dispatching Rules for Raising Hit Rate in Wafer Fabs
author_sort Cheng-Feng Kao
title Dispatching Rules for Raising Hit Rate in Wafer Fabs
title_short Dispatching Rules for Raising Hit Rate in Wafer Fabs
title_full Dispatching Rules for Raising Hit Rate in Wafer Fabs
title_fullStr Dispatching Rules for Raising Hit Rate in Wafer Fabs
title_full_unstemmed Dispatching Rules for Raising Hit Rate in Wafer Fabs
title_sort dispatching rules for raising hit rate in wafer fabs
publishDate 2003
url http://ndltd.ncl.edu.tw/handle/54068718018533689007
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