Test and Measurement Methodology for High Speed Serial Link
碩士 === 國立中央大學 === 電機工程研究所 === 91 === Abstract In this thesis, we proposed a novel methodology to test high speed circuit. We divide our testing methodology into two parts. The first one is the eye diagram testing methodology. We can obtain the signal mean, signal noise, and jitter from eye diag...
Main Authors: | Tian-Yi Lin, 林恬怡 |
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Other Authors: | Chien-Nan Liu |
Format: | Others |
Language: | en_US |
Published: |
2003
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Online Access: | http://ndltd.ncl.edu.tw/handle/71765112647505243751 |
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