Test and Measurement Methodology for High Speed Serial Link

碩士 === 國立中央大學 === 電機工程研究所 === 91 === Abstract In this thesis, we proposed a novel methodology to test high speed circuit. We divide our testing methodology into two parts. The first one is the eye diagram testing methodology. We can obtain the signal mean, signal noise, and jitter from eye diag...

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Bibliographic Details
Main Authors: Tian-Yi Lin, 林恬怡
Other Authors: Chien-Nan Liu
Format: Others
Language:en_US
Published: 2003
Online Access:http://ndltd.ncl.edu.tw/handle/71765112647505243751

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