A Study of Edge Tracing Measurement using Autofocus Technology

• Main Authors: Weng-Wei-Chang, 翁偉昌
• Other Authors: Wu-Ming-Chuan
• Format: Others
• Language: zh-TW
• Published: 2003
• Online Access: http://ndltd.ncl.edu.tw/handle/49685381371938585024

碩士 === 國立臺北科技大學 === 機電整合研究所 === 91 === The purpose of this research is to develop an active edge tracing system by using X-Y table and a high analytic CCD camera and a programable zoon lens.The system of our development need a front lighting or back lighting judged by object’s kind.At the same time we use Subpixel and Autofocus technology By same way we can raise our image’s resolution and measurement systm precisionly.Under study we match up for the digital image processing and image’s algorithm , such as Laplacian of Gaussian , Thining , Chain Code in open curve , Image overlapping , Supixel theorem , Intelligent program of the focus rule etc ..., we can get irregular object’s edging data precisionly. Under study we use the limited instrument and apply image’s algorithm. We develop software to improve for computer hardware. In finally we can raise image’s analytic problem. At another way, We develop X-Y table’s automation. So we can reduce people’s judgement and measurement uncertainly.By the same way we can increase measurement’s precision ; In the experimentation process, first we adjust our image focus until on a precision focal distance. Then we measure some tiny or slight lines by using a blow up CCD camera. Then we use the Subpixel theory. In finally we match up those magnified lines, we can get a object’s edging point precisionly. Anther way, we can collocate our different kind of database which we write to get our eigenvalue. And we can use our eigenvalue to judge for those fault products. We can increase tolerance in those fauled products.