Measurement and failure analysis of wafer probe testing contact resistance
碩士 === 國立中正大學 === 機械系 === 92 ===
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| Format: | Others |
| Language: | zh-TW |
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2004
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| Online Access: | http://ndltd.ncl.edu.tw/handle/09657629533550316724 |
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ndltd-TW-092CCU00489067 |
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ndltd-TW-092CCU004890672016-01-04T04:08:30Z http://ndltd.ncl.edu.tw/handle/09657629533550316724 Measurement and failure analysis of wafer probe testing contact resistance 晶圓針測探針之接觸電阻量測方法與失效分析 黃惟孝 碩士 國立中正大學 機械系 92 劉德騏 2004 學位論文 ; thesis 0 zh-TW |
| collection |
NDLTD |
| language |
zh-TW |
| format |
Others
|
| sources |
NDLTD |
| description |
碩士 === 國立中正大學 === 機械系 === 92 ===
|
| author2 |
劉德騏 |
| author_facet |
劉德騏 黃惟孝 |
| author |
黃惟孝 |
| spellingShingle |
黃惟孝 Measurement and failure analysis of wafer probe testing contact resistance |
| author_sort |
黃惟孝 |
| title |
Measurement and failure analysis of wafer probe testing contact resistance |
| title_short |
Measurement and failure analysis of wafer probe testing contact resistance |
| title_full |
Measurement and failure analysis of wafer probe testing contact resistance |
| title_fullStr |
Measurement and failure analysis of wafer probe testing contact resistance |
| title_full_unstemmed |
Measurement and failure analysis of wafer probe testing contact resistance |
| title_sort |
measurement and failure analysis of wafer probe testing contact resistance |
| publishDate |
2004 |
| url |
http://ndltd.ncl.edu.tw/handle/09657629533550316724 |
| work_keys_str_mv |
AT huángwéixiào measurementandfailureanalysisofwaferprobetestingcontactresistance AT huángwéixiào jīngyuánzhēncètànzhēnzhījiēchùdiànzǔliàngcèfāngfǎyǔshīxiàofēnxī |
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1718158304155271168 |