Development of Non-Defective Real-Time InspectionSignal Processing Technology - Applications of Non-Destructive Testing for Color Filters

• Main Authors: Li-Sheng Chen, 陳立盛
• Other Authors: Fu-Shin Lee
• Format: Others
• Language: zh-TW
• Published: 2004
• Online Access: http://ndltd.ncl.edu.tw/handle/74975026179406243814

碩士 === 華梵大學 === 機電工程研究所 === 92 === The object of this thesis is to develop a fully automatic inspection apparatus for quality control purposes on color filters. The setup can analyze image pixels on color filters for visible light ranging from 350 nm to 850 nm, with a light wavelength resolution up to 3.49 nm as adopting a microspectrmeter. The developed system can magnify the pixels six times through arranged optical lens, and certain optical fibers are aimed to acquire the images of the pixels for R, G, and B color spectrum inspections. An XYZ stage holding the inspected color filter moves along on a scanning path prescribed by a CNC controller, and the microspectrometer grabs the targeted pixel images on the color filter for spectrum inspection, which is reiterated in a 4 ms sampling period fashion. The acquired spectrum information of the pixels on the color filter is stored in certain files of a PC computer. With the accumulated information in the PC, this research builds a quality inspection coding to analyze the color properties, and perform certain statistics evaluations of the pixels on the color filter automatically. With the analysis results of the whole piece color filter, its color quality can be justified, and any defects of the pixels on the filter can also be detected.