A Study of Nano Porous Silica Powder Effect In PCB Resin System

碩士 === 義守大學 === 材料科學與工程學系 === 92 === In order to reduce the PCB dielectric, confer whole dielectric characters, machinery characters, and preparing process. Nano-size silica has porous structure;the air and in vacuum the dielectric constant are 1. Using the character to reduce the dielect...

Full description

Bibliographic Details
Main Authors: CHEN MENG KAI, 曾盟凱
Other Authors: Cho Liahg Chung
Format: Others
Language:zh-TW
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/91578434103447498294
id ndltd-TW-092ISU00159021
record_format oai_dc
spelling ndltd-TW-092ISU001590212016-01-04T04:09:17Z http://ndltd.ncl.edu.tw/handle/91578434103447498294 A Study of Nano Porous Silica Powder Effect In PCB Resin System 奈米級中空矽粉對電路板樹脂之特性影響研究 CHEN MENG KAI 曾盟凱 碩士 義守大學 材料科學與工程學系 92 In order to reduce the PCB dielectric, confer whole dielectric characters, machinery characters, and preparing process. Nano-size silica has porous structure;the air and in vacuum the dielectric constant are 1. Using the character to reduce the dielectric constant substantially in PCB. Besides, to confer the effect of epoxy system additive nano-porous silica. The dielectric constant is reduced by the increasing nano-porous silica content. In low content rate of nano-porous silica, epoxy has nice preparing condition. In epoxy system, the dielectric constant reduce 0.96 from pure epoxy to 5phr rate(3.28~2.32). In PCB system, the dielectric constant reduce 0.15 from pure epoxy to 5phr rate(4.38~4.23). In PCB manufacturing process, we use various instruments to find the mathematics. For example, we can find the range of solvent vaporizing(45OC~80OC), using this data can design baking temperature. In DSC data, it can known the temperature which epoxy harden is 175 OC. In experiment, the dielectric constant of nano-porous silica, using Mixture rule equation to calculate it. Finally, calculating the dielectric constant of nano-porous silica is 1.545. Cho Liahg Chung 鍾卓良 2004 學位論文 ; thesis 78 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 義守大學 === 材料科學與工程學系 === 92 === In order to reduce the PCB dielectric, confer whole dielectric characters, machinery characters, and preparing process. Nano-size silica has porous structure;the air and in vacuum the dielectric constant are 1. Using the character to reduce the dielectric constant substantially in PCB. Besides, to confer the effect of epoxy system additive nano-porous silica. The dielectric constant is reduced by the increasing nano-porous silica content. In low content rate of nano-porous silica, epoxy has nice preparing condition. In epoxy system, the dielectric constant reduce 0.96 from pure epoxy to 5phr rate(3.28~2.32). In PCB system, the dielectric constant reduce 0.15 from pure epoxy to 5phr rate(4.38~4.23). In PCB manufacturing process, we use various instruments to find the mathematics. For example, we can find the range of solvent vaporizing(45OC~80OC), using this data can design baking temperature. In DSC data, it can known the temperature which epoxy harden is 175 OC. In experiment, the dielectric constant of nano-porous silica, using Mixture rule equation to calculate it. Finally, calculating the dielectric constant of nano-porous silica is 1.545.
author2 Cho Liahg Chung
author_facet Cho Liahg Chung
CHEN MENG KAI
曾盟凱
author CHEN MENG KAI
曾盟凱
spellingShingle CHEN MENG KAI
曾盟凱
A Study of Nano Porous Silica Powder Effect In PCB Resin System
author_sort CHEN MENG KAI
title A Study of Nano Porous Silica Powder Effect In PCB Resin System
title_short A Study of Nano Porous Silica Powder Effect In PCB Resin System
title_full A Study of Nano Porous Silica Powder Effect In PCB Resin System
title_fullStr A Study of Nano Porous Silica Powder Effect In PCB Resin System
title_full_unstemmed A Study of Nano Porous Silica Powder Effect In PCB Resin System
title_sort study of nano porous silica powder effect in pcb resin system
publishDate 2004
url http://ndltd.ncl.edu.tw/handle/91578434103447498294
work_keys_str_mv AT chenmengkai astudyofnanoporoussilicapowdereffectinpcbresinsystem
AT céngméngkǎi astudyofnanoporoussilicapowdereffectinpcbresinsystem
AT chenmengkai nàimǐjízhōngkōngxìfěnduìdiànlùbǎnshùzhīzhītèxìngyǐngxiǎngyánjiū
AT céngméngkǎi nàimǐjízhōngkōngxìfěnduìdiànlùbǎnshùzhīzhītèxìngyǐngxiǎngyánjiū
AT chenmengkai studyofnanoporoussilicapowdereffectinpcbresinsystem
AT céngméngkǎi studyofnanoporoussilicapowdereffectinpcbresinsystem
_version_ 1718160108212453376