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碩士 === 國立成功大學 === 材料科學及工程學系碩博士班 === 92 ===   ITO film has high properties of transmittance and conductance in the visible range. Because of its special optical and electrical properties, it is used for many applications. The resistivity of ITO film and the content of Sn have deep relationship and th...

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Main Authors: Wen-Yen Chuang, 莊文彥
Other Authors: Tien-Chai Lin
Format: Others
Language:zh-TW
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/54087434167325533493
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spelling ndltd-TW-092NCKU51590662016-06-17T04:16:39Z http://ndltd.ncl.edu.tw/handle/54087434167325533493 none 以共沈積法製備ITO透明導電薄膜添加異質金屬之特性研究 Wen-Yen Chuang 莊文彥 碩士 國立成功大學 材料科學及工程學系碩博士班 92   ITO film has high properties of transmittance and conductance in the visible range. Because of its special optical and electrical properties, it is used for many applications. The resistivity of ITO film and the content of Sn have deep relationship and the resistivity increased while the content of Sn decreased in deposition process. The other hand, the roughness of ITO film is an important factor to optical-electrical devices performance. Therefore, we added different kinds of material (Sn, Ti, Cr) into the ITO film by co-sputtering system with various parameters to investigate properties of these films. In advanced, we also took the post-annealing experiments to expect having outstanding properties.   Experimental results revealed, when added tin, titanium and chromium with 7.5W, 5W and 15W, respectively, they could supply additional carries for ITO film to decrease resistivity. The minimum resistivity of the films were attained to 6.63×10-4Ω.cm, 6.64×10-4Ω.cm and 8.64×10-4Ω.cm, respectively, then the transmittance in visible range could also reached 80%. SEM and AFM surface morphologies show that added tin, titanium and chromium could restrain the clusters, the root-mean-square(Rrms) values were below 1nm.   Post-annealing experiments proved that added tin at low annealing temperature did not fit the B-M theory, then added titanium and chromium at 250℃ could supply a great quantity of carries. The carrier concentrations of the different films were all increased at 450℃, the minimum resistivity of the films reached 2.67×10-4Ω.cm. The root-mean-square values all decreased below 1.5nm, and the peak-to-vale(Rp-v)values also decreased. The transmittance in the visible range after post-annealing is increased, the maximum values attained 92%. Tien-Chai Lin Shih-Chin Lee 林天財 李世欽 2004 學位論文 ; thesis 117 zh-TW
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description 碩士 === 國立成功大學 === 材料科學及工程學系碩博士班 === 92 ===   ITO film has high properties of transmittance and conductance in the visible range. Because of its special optical and electrical properties, it is used for many applications. The resistivity of ITO film and the content of Sn have deep relationship and the resistivity increased while the content of Sn decreased in deposition process. The other hand, the roughness of ITO film is an important factor to optical-electrical devices performance. Therefore, we added different kinds of material (Sn, Ti, Cr) into the ITO film by co-sputtering system with various parameters to investigate properties of these films. In advanced, we also took the post-annealing experiments to expect having outstanding properties.   Experimental results revealed, when added tin, titanium and chromium with 7.5W, 5W and 15W, respectively, they could supply additional carries for ITO film to decrease resistivity. The minimum resistivity of the films were attained to 6.63×10-4Ω.cm, 6.64×10-4Ω.cm and 8.64×10-4Ω.cm, respectively, then the transmittance in visible range could also reached 80%. SEM and AFM surface morphologies show that added tin, titanium and chromium could restrain the clusters, the root-mean-square(Rrms) values were below 1nm.   Post-annealing experiments proved that added tin at low annealing temperature did not fit the B-M theory, then added titanium and chromium at 250℃ could supply a great quantity of carries. The carrier concentrations of the different films were all increased at 450℃, the minimum resistivity of the films reached 2.67×10-4Ω.cm. The root-mean-square values all decreased below 1.5nm, and the peak-to-vale(Rp-v)values also decreased. The transmittance in the visible range after post-annealing is increased, the maximum values attained 92%.
author2 Tien-Chai Lin
author_facet Tien-Chai Lin
Wen-Yen Chuang
莊文彥
author Wen-Yen Chuang
莊文彥
spellingShingle Wen-Yen Chuang
莊文彥
none
author_sort Wen-Yen Chuang
title none
title_short none
title_full none
title_fullStr none
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publishDate 2004
url http://ndltd.ncl.edu.tw/handle/54087434167325533493
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