IEEE Std. 1149.4 Compatible Analog BIST Methodology
碩士 === 國立交通大學 === 電機資訊學院碩士在職專班 === 92 === A dynamic analog BIST methodology is proposed based on IEEE std. 1149.4 DFT infrastructure in this thesis. The on-chip generated triangular stimulus is sent to the analog CUT through the analog test buses and the response is quantized by the dual comparators...
Main Authors: | , |
---|---|
Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2004
|
Online Access: | http://ndltd.ncl.edu.tw/handle/67469616504008031384 |
id |
ndltd-TW-092NCTU5441012 |
---|---|
record_format |
oai_dc |
spelling |
ndltd-TW-092NCTU54410122015-10-13T13:04:41Z http://ndltd.ncl.edu.tw/handle/67469616504008031384 IEEE Std. 1149.4 Compatible Analog BIST Methodology 相容於IEEEStd.1149.4類比自我測試方法 Te-Sung, Tu 涂德松 碩士 國立交通大學 電機資訊學院碩士在職專班 92 A dynamic analog BIST methodology is proposed based on IEEE std. 1149.4 DFT infrastructure in this thesis. The on-chip generated triangular stimulus is sent to the analog CUT through the analog test buses and the response is quantized by the dual comparators. Statistical analysis is conducted to enhance the quantization resolution and minimize the noise effect. The experimental results by hardware emulation confirm the feasibility of the proposed methodology. Chung-Len, Lee Chau-Chin, Su 李崇仁 蘇朝琴 2004 學位論文 ; thesis 70 zh-TW |
collection |
NDLTD |
language |
zh-TW |
format |
Others
|
sources |
NDLTD |
description |
碩士 === 國立交通大學 === 電機資訊學院碩士在職專班 === 92 === A dynamic analog BIST methodology is proposed based on IEEE std. 1149.4 DFT infrastructure in this thesis. The on-chip generated triangular stimulus is sent to the analog CUT through the analog test buses and the response is quantized by the dual comparators. Statistical analysis is conducted to enhance the quantization resolution and minimize the noise effect. The experimental results by hardware emulation confirm the feasibility of the proposed methodology.
|
author2 |
Chung-Len, Lee |
author_facet |
Chung-Len, Lee Te-Sung, Tu 涂德松 |
author |
Te-Sung, Tu 涂德松 |
spellingShingle |
Te-Sung, Tu 涂德松 IEEE Std. 1149.4 Compatible Analog BIST Methodology |
author_sort |
Te-Sung, Tu |
title |
IEEE Std. 1149.4 Compatible Analog BIST Methodology |
title_short |
IEEE Std. 1149.4 Compatible Analog BIST Methodology |
title_full |
IEEE Std. 1149.4 Compatible Analog BIST Methodology |
title_fullStr |
IEEE Std. 1149.4 Compatible Analog BIST Methodology |
title_full_unstemmed |
IEEE Std. 1149.4 Compatible Analog BIST Methodology |
title_sort |
ieee std. 1149.4 compatible analog bist methodology |
publishDate |
2004 |
url |
http://ndltd.ncl.edu.tw/handle/67469616504008031384 |
work_keys_str_mv |
AT tesungtu ieeestd11494compatibleanalogbistmethodology AT túdésōng ieeestd11494compatibleanalogbistmethodology AT tesungtu xiāngróngyúieeestd11494lèibǐzìwǒcèshìfāngfǎ AT túdésōng xiāngróngyúieeestd11494lèibǐzìwǒcèshìfāngfǎ |
_version_ |
1717729887696977920 |