Life-End Detection and Protection of High-Frequency Electronic Ballast Driven Fluorescent Lamps
碩士 === 國立中山大學 === 電機工程學系研究所 === 92 === The fault phenomena of fluorescent lamps are investigated by observing the operations in the last period of the life cycle. Accordingly, fault detecting and protection circuits are designed. Before coming to the life-end, the lamps can be started up, but are...
Main Authors: | Cheng-Chung Lee, 李正中 |
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Other Authors: | Chin-Sien Moo |
Format: | Others |
Language: | zh-TW |
Published: |
2004
|
Online Access: | http://ndltd.ncl.edu.tw/handle/98353811699667868349 |
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