Nonlinear properties of optoelectronic semiconductors and nano-thin film studied by Z-scan measurement

• Main Authors: Yan-Lan Lu, 呂彥嵐
• Other Authors: Hai-Pang Chiang
• Format: Others
• Language: zh-TW
• Published: 2004
• Online Access: http://ndltd.ncl.edu.tw/handle/61404634328075546690

碩士 === 國立臺灣海洋大學 === 光電科學研究所 === 92 === Abstract In this thesis, we study nonlinear optical properties of optoelectronic ZnO and Au nanometer thin films with different thickness under different laser powers by z-scan in which we use a pulsed laser (wavelength=532 nm, pulse width=0.71 ns, repetition rate=15.29 KHz) as the light Source. In addition, we fit experimental data of Au thin film of different thickness to get nonlinear absorption/refraction coefficients β/γ. Interestingly, we add a measurement device in our experimental setup to detect reflective optical signal of Au/ZnO thin films with different thickness.