Nonlinear properties of optoelectronic semiconductors and nano-thin film studied by Z-scan measurement

碩士 === 國立臺灣海洋大學 === 光電科學研究所 === 92 === Abstract In this thesis, we study nonlinear optical properties of optoelectronic ZnO and Au nanometer thin films with different thickness under different laser powers by z-scan in which we use a pulsed laser (wavelength=532 nm, pulse width=0.71 ns, repetition...

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Bibliographic Details
Main Authors: Yan-Lan Lu, 呂彥嵐
Other Authors: Hai-Pang Chiang
Format: Others
Language:zh-TW
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/61404634328075546690

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