Study of CoTbX thin films (X=Pd, Cu, Au, Pt) and their possibility for application to the single layer thermo-magnetic recording media

• Main Authors: Chao-Te Lee, 李昭德
• Other Authors: Po-Cheng Kuo
• Format: Others
• Language: zh-TW
• Published: 2003
• Online Access: http://ndltd.ncl.edu.tw/handle/82592645962800594272

博士 === 國立臺灣大學 === 材料科學與工程學研究所 === 92 === The CoTbX films (X=Pd, Cu, Au, Pt, Ni, Al) were deposited on glass and naturally oxidized silicon wafer substrates at room temperature by dc magnetron sputtering. The magnetic film was sandwiched by SiNx protective layers to prevent oxidization. The SiNx protective layers were produced by rf magnetron sputtering of Si3N4 target Thickness of the magnetic layer and SiNx layer were 75 nm and 30 nm, respectively. The effects of X content (where X=Pd, Cu, Au, Pt, Ni, Al) on the magnetic properties and microstructure of the film were investigated. The X-ray diffraction and transmission electron microscope diffraction pattern revealed that all the films were amorphous. It shows that substituting small amount of Co for non-magnetic element Cu，Au or Pt will increase the saturation magnetization, the perpendicular remanence of the Co70.5Tb29.5 film. It was found that the saturation magnetization of the Co67.25Tb29.5Pt3.25 film is about 330 emu/cm3, the perpendicular squareness is about 0.85, perpendicular coercivity is about 2500 Oe at room temperature. This film is a promising candidate for hybrid recording media applications.