Wavelet-based Texture Defect Inspection
碩士 === 元智大學 === 通訊工程學系 === 92 === Defects are detected in homogeneously texture. The way is to find un-homogenous texture. Texture analysis plays an important role in texture defect inspection. In this thesis, we present a coarse-to-fine approach for automatic vision-based inspection syst...
Main Authors: | Hui-Wen Chien, 簡慧文 |
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Other Authors: | Jeich Mar |
Format: | Others |
Language: | en_US |
Published: |
2004
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Online Access: | http://ndltd.ncl.edu.tw/handle/98791777670168730035 |
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