Wavelet-based Texture Defect Inspection

碩士 === 元智大學 === 通訊工程學系 === 92 === Defects are detected in homogeneously texture. The way is to find un-homogenous texture. Texture analysis plays an important role in texture defect inspection. In this thesis, we present a coarse-to-fine approach for automatic vision-based inspection syst...

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Bibliographic Details
Main Authors: Hui-Wen Chien, 簡慧文
Other Authors: Jeich Mar
Format: Others
Language:en_US
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/98791777670168730035

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